Online College Courses for Credit

+
AFM Contact Mode Probes

AFM Contact Mode Probes

Rating:
Rating
(0)
Author: murphy wu
Description:

AFM Contact Mode Probes

The mode in which the probe is in close contact with the sample surface is a mode commonly used in atomic force microscopy, and it provides the basis for many other AFM modes. The contact mode uses a micromachined AFM probe mounted on the cantilever. During the scanning process, the afm needle tip and the sample are in constant contact.

(more)
See More
Fast, Free College Credit

Developing Effective Teams

Let's Ride
*No strings attached. This college course is 100% free and is worth 1 semester credit.

37 Sophia partners guarantee credit transfer.

299 Institutions have accepted or given pre-approval for credit transfer.

* The American Council on Education's College Credit Recommendation Service (ACE Credit®) has evaluated and recommended college credit for 33 of Sophia’s online courses. Many different colleges and universities consider ACE CREDIT recommendations in determining the applicability to their course and degree programs.

Tutorial