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AFM Contact Mode Probes

AFM Contact Mode Probes

Author: murphy wu

AFM Contact Mode Probes

The mode in which the probe is in close contact with the sample surface is a mode commonly used in atomic force microscopy, and it provides the basis for many other AFM modes. The contact mode uses a micromachined AFM probe mounted on the cantilever. During the scanning process, the afm needle tip and the sample are in constant contact.

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