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AFM Probe Functionalization

AFM Probe Functionalization

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Author: murphy wu
Description:

Atomic
force microscopy (AFM) is a surface characterization instrument which
utilizes a tip to “feel” the surface. AFM has great potential as a tool for
materials science studies in that it not only is a tool to image the
topography of solid surfaces at high resolution, but also characterizes the
surface mechanical, electrical and other properties.

https://www.matexcel.com/services/afm-probe-functionalization/

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