Online College Courses for Credit

Conductive AFM Probes

Conductive AFM Probes

Author: murphy wu

Conductive AFM Probes

Conductive AFM (CAFM) is a mode in Atomic Force Microscope (AFM), which simultaneously measures the topography of the material and the current at the contact point between the electrode tip and the sample surface. The sample's shape is measured by using an optical system to detect the deflection of the cantilever, while a current-to-voltage preamplifier is used to detect the current. CAFM usually operates in contact mode. The tip can be held in one position while applying/reading voltage and current signals, or the tip can be moved to scan a specific area of the sample (and collect current) at a constant voltage.

See More
Fast, Free College Credit

Developing Effective Teams

Let's Ride
*No strings attached. This college course is 100% free and is worth 1 semester credit.

37 Sophia partners guarantee credit transfer.

299 Institutions have accepted or given pre-approval for credit transfer.

* The American Council on Education's College Credit Recommendation Service (ACE Credit®) has evaluated and recommended college credit for 33 of Sophia’s online courses. Many different colleges and universities consider ACE CREDIT recommendations in determining the applicability to their course and degree programs.