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Conductive AFM Probes

Conductive AFM Probes

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Author: murphy wu
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Conductive AFM Probes

Conductive AFM (CAFM) is a mode in Atomic Force Microscope (AFM), which simultaneously measures the topography of the material and the current at the contact point between the electrode tip and the sample surface. The sample's shape is measured by using an optical system to detect the deflection of the cantilever, while a current-to-voltage preamplifier is used to detect the current. CAFM usually operates in contact mode. The tip can be held in one position while applying/reading voltage and current signals, or the tip can be moved to scan a specific area of the sample (and collect current) at a constant voltage.

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