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High Aspect Ratio AFM Probes

High Aspect Ratio AFM Probes

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Author: Creative Diagnostics
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High Aspect Ratio AFM Probes

The spatial resolution of the surface imaged by the atomic force microscope depends on two properties of the tip: the radius of the tip and the aspect ratio. The aspect ratio refers to the ratio of the height and width of the AFM tip. The standard AFM probe made of silicon has a conical, pyramidal or tetrahedral tip. The conical tip can be manufactured to have a relatively high aspect ratio.

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